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Figure4-1.svg Aug 15, 2025 - JART ECM v1 var SVG Image - 472.2 KB - SHA-256: f26c2966faa0d6b864005f77e04cf39fd43c806141d3c40295712f5feb5b964c [1] (a) Experimentally measured and (b) simulatively verified device-to-device variability for SET kinetics analysis. Simulation also includes the SET kinetics curve obtained by mean parameter values (in black). It shows the first steeper slope from 0.3–3.5 V related to the elec...
Figure5-1.svg Aug 15, 2025 - JART ECM v1 var SVG Image - 3.5 MB - SHA-256: 43512b47f9b59bfa5115c31ecd176af8ed90db32194f30370b8b98abde9e3537 [2] Experimentally measured I–V sweeps in red, simulated I–V sweeps in blue: (a) experimentally recorded I–V sweep, (b) simulated I–V sweep characteristics with all four modifications, (c) only staircase I–V sweep and parameter variation after each SET and RESET, (d) only stair...
Figure 3 new-1.svg Aug 15, 2025 - JART v-ECM v1 SVG Image - 996.7 KB - SHA-256: e05d35a6ca3c658a0b666d197f06274eedd3345bb03f215fe47638d111116a64 [1] (a) 30 cycles of measured I-V sweeps of a Ag-HfO2-Pt ECM device stack are shown. A c2c variability is visible. (b) 30 cycles of simulated I-V sweeps are shown through the usage of the (variability-aware) volatile ECM model. For both, measurement and simulation, the device...
Figure 4 new-1.svg Aug 15, 2025 - JART v-ECM v1 SVG Image - 563.5 KB - SHA-256: e8ced5836ba74af09e38ac51313c2061a7aef7697b7e94c37d2d5f99d4a97bfd [2] The experimentally measured threshold switching kinetics data points of a Ag-HfO2-Pt ECM device stack together with their d2d variability are displayed in red, whereas the simulated ones with their d2d variability are displayed in blue.
Figure 5 new-1.svg Aug 15, 2025 - JART v-ECM v1 SVG Image - 20.9 MB - SHA-256: b8e0c44689a90ae87c7470684765ef9220ff2b618c22ce324442338db61e51b2 [3] (a) The applied voltage signal to a Ag-HfO2-Pt ECM device stack in the measurement and in the simulation in order to investigate the device’s relaxation behavior: The 1 ms programming/write pulse of Vp is followed by a read voltage Vread = 0.1 V. The inset shows that the sign...
Figure 3 new.svg Aug 15, 2025 - JART v-ECM v1 var SVG Image - 996.7 KB - SHA-256: e05d35a6ca3c658a0b666d197f06274eedd3345bb03f215fe47638d111116a64 [1] (a) 30 cycles of measured I-V sweeps of a Ag-HfO2-Pt ECM device stack are shown. A c2c variability is visible. (b) 30 cycles of simulated I-V sweeps are shown through the usage of the variability-aware volatile ECM model. For both, measurement and simulation, the device switc...
Figure 4 new.svg Aug 15, 2025 - JART v-ECM v1 var SVG Image - 563.5 KB - SHA-256: e8ced5836ba74af09e38ac51313c2061a7aef7697b7e94c37d2d5f99d4a97bfd [2] The experimentally measured threshold switching kinetics data points of a Ag-HfO2-Pt ECM device stack together with their d2d variability are displayed in red, whereas the simulated ones with their d2d variability are displayed in blue.
Figure 5 new.svg Aug 15, 2025 - JART v-ECM v1 var SVG Image - 20.9 MB - SHA-256: b8e0c44689a90ae87c7470684765ef9220ff2b618c22ce324442338db61e51b2 [3] (a) The applied voltage signal to a Ag-HfO2-Pt ECM device stack in the measurement and in the simulation in order to investigate the device’s relaxation behavior: The 1 ms programming/write pulse of Vp is followed by a read voltage Vread = 0.1 V. The inset shows that the sign...
1ML_HeI_PE50_MCP_Mesh_AV_250116.TIF Aug 12, 2025 - Data used in: Coverage-dependent electronic and geometric structure of sexithiophene on Cu(110)-p(2x1)O TIFF Image - 2.0 MB - SHA-256: 7df41dd6bece85a566c644b48e04ce310feb44e1286bb0ee828588b4c37fb75f
2ML_HeI_PE50_MCP_Mesh_AV_240801.TIF Aug 12, 2025 - Data used in: Coverage-dependent electronic and geometric structure of sexithiophene on Cu(110)-p(2x1)O TIFF Image - 2.0 MB - SHA-256: 9f2962b2b149722a192470b7eed9acfc06f4154cc7794382a1b27618ef72eda7

Figure4-1.svg

Aug 15, 2025 - JART ECM v1 var

SVG Image - 472.2 KB - SHA-256: f26c2966faa0d6b864005f77e04cf39fd43c806141d3c40295712f5feb5b964c

[1] (a) Experimentally measured and (b) simulatively verified device-to-device variability for SET kinetics analysis. Simulation also includes the SET kinetics curve obtained by mean parameter values (in black). It shows the first steeper slope from 0.3–3.5 V related to the elec...

Figure5-1.svg

Aug 15, 2025 - JART ECM v1 var

SVG Image - 3.5 MB - SHA-256: 43512b47f9b59bfa5115c31ecd176af8ed90db32194f30370b8b98abde9e3537

[2] Experimentally measured I–V sweeps in red, simulated I–V sweeps in blue: (a) experimentally recorded I–V sweep, (b) simulated I–V sweep characteristics with all four modifications, (c) only staircase I–V sweep and parameter variation after each SET and RESET, (d) only stair...

Figure 3 new-1.svg

Aug 15, 2025 - JART v-ECM v1

SVG Image - 996.7 KB - SHA-256: e05d35a6ca3c658a0b666d197f06274eedd3345bb03f215fe47638d111116a64

[1] (a) 30 cycles of measured I-V sweeps of a Ag-HfO2-Pt ECM device stack are shown. A c2c variability is visible. (b) 30 cycles of simulated I-V sweeps are shown through the usage of the (variability-aware) volatile ECM model. For both, measurement and simulation, the device...

Figure 4 new-1.svg

Aug 15, 2025 - JART v-ECM v1

SVG Image - 563.5 KB - SHA-256: e8ced5836ba74af09e38ac51313c2061a7aef7697b7e94c37d2d5f99d4a97bfd

[2] The experimentally measured threshold switching kinetics data points of a Ag-HfO2-Pt ECM device stack together with their d2d variability are displayed in red, whereas the simulated ones with their d2d variability are displayed in blue.

Figure 5 new-1.svg

Aug 15, 2025 - JART v-ECM v1

SVG Image - 20.9 MB - SHA-256: b8e0c44689a90ae87c7470684765ef9220ff2b618c22ce324442338db61e51b2

[3] (a) The applied voltage signal to a Ag-HfO2-Pt ECM device stack in the measurement and in the simulation in order to investigate the device’s relaxation behavior: The 1 ms programming/write pulse of Vp is followed by a read voltage Vread = 0.1 V. The inset shows that the sign...

Figure 3 new.svg

Aug 15, 2025 - JART v-ECM v1 var

SVG Image - 996.7 KB - SHA-256: e05d35a6ca3c658a0b666d197f06274eedd3345bb03f215fe47638d111116a64

[1] (a) 30 cycles of measured I-V sweeps of a Ag-HfO2-Pt ECM device stack are shown. A c2c variability is visible. (b) 30 cycles of simulated I-V sweeps are shown through the usage of the variability-aware volatile ECM model. For both, measurement and simulation, the device switc...

Figure 4 new.svg

Aug 15, 2025 - JART v-ECM v1 var

SVG Image - 563.5 KB - SHA-256: e8ced5836ba74af09e38ac51313c2061a7aef7697b7e94c37d2d5f99d4a97bfd

Figure 5 new.svg

Aug 15, 2025 - JART v-ECM v1 var

SVG Image - 20.9 MB - SHA-256: b8e0c44689a90ae87c7470684765ef9220ff2b618c22ce324442338db61e51b2

1ML_HeI_PE50_MCP_Mesh_AV_250116.TIF

Aug 12, 2025 - Data used in: Coverage-dependent electronic and geometric structure of sexithiophene on Cu(110)-p(2x1)O

TIFF Image - 2.0 MB - SHA-256: 7df41dd6bece85a566c644b48e04ce310feb44e1286bb0ee828588b4c37fb75f

2ML_HeI_PE50_MCP_Mesh_AV_240801.TIF

Aug 12, 2025 - Data used in: Coverage-dependent electronic and geometric structure of sexithiophene on Cu(110)-p(2x1)O

TIFF Image - 2.0 MB - SHA-256: 9f2962b2b149722a192470b7eed9acfc06f4154cc7794382a1b27618ef72eda7

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