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Type: (files OR datasets)

31 to 40 of 19,326 Results

data_readnoise_sample_C.pkl Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices Unknown - 148.0 MB - SHA-256: 65b38a04f71cb4ec9bbd27987be7943234a24529f7df229b99dee676f24f4b6b
Functions_datahandle.py Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices Python Source Code - 29.3 KB - SHA-256: 6f2c31315617763d3e3b03d6571619edc2567c13c3535217364fa88ec7f37e40
ReadMe.txt Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices Plain Text - 2.1 KB - SHA-256: ee0d72deb8d8f29192558bb509bf664bdf4b92f5d69c87647d08d68e59bd184b
Store_data.py Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices Python Source Code - 5.6 KB - SHA-256: 5449119bca17aaa988fc91e52f7f6a55e1e993e0aba0c817d6f79071984564a3
Automatische Standardsimulation mGROWA2025_B für das Land Nordrhein-Westfalen (NRW) für den Zeitraum 1961 bis zum Vormonat Aug 15, 2025 - mGROWA North Rhine-Westphalia Herrmann, Frank, 2025, "Automatische Standardsimulation mGROWA2025_B für das Land Nordrhein-Westfalen (NRW) für den Zeitraum 1961 bis zum Vormonat", https://doi.org/10.26165/JUELICH-DATA/ZNVQCX, Jülich DATA, V1 Die bereitgestellten Rasterdaten umfassen Monats- und Jahressummen mehrerer Wasserhaushaltsgrößen aus der derzeitigen Standardsimulation mGROWA2025_B mit dem Modell mGROWA. Die Standardsimulation startet im Jahr 1961 und wird monatlich im Rahmen des WHDM-NRW (Wasserhaushalts- und...
JART ECM v1 var Aug 15, 2025 - Peter Grünberg Institute (PGI) – Electronic Materials (PGI-7) Ahmad, Rana Walied; Menzel, Stephan, 2025, "JART ECM v1 var", https://doi.org/10.26165/JUELICH-DATA/WHSSZA, Jülich DATA, V1 A purely physics-based variability-aware compact model of electrochemical metallization memory (ECM) cells is presented. Since this extension consists of several different features allowing for a realistic variability-aware fit, it depicts a unique model comprising physics-based,...
Figure4-1.svg Aug 15, 2025 - JART ECM v1 var SVG Image - 472.2 KB - SHA-256: f26c2966faa0d6b864005f77e04cf39fd43c806141d3c40295712f5feb5b964c [1] (a) Experimentally measured and (b) simulatively verified device-to-device variability for SET kinetics analysis. Simulation also includes the SET kinetics curve obtained by mean parameter values (in black). It shows the first steeper slope from 0.3–3.5 V related to the elec...
Figure5-1.svg Aug 15, 2025 - JART ECM v1 var SVG Image - 3.5 MB - SHA-256: 43512b47f9b59bfa5115c31ecd176af8ed90db32194f30370b8b98abde9e3537 [2] Experimentally measured I–V sweeps in red, simulated I–V sweeps in blue: (a) experimentally recorded I–V sweep, (b) simulated I–V sweep characteristics with all four modifications, (c) only staircase I–V sweep and parameter variation after each SET and RESET, (d) only stair...
veriloga.va Aug 15, 2025 - JART ECM v1 var Unknown - 16.8 KB - SHA-256: 606b87666352d6eb8141790f1e42232982be8ac3e92169198ed520a88a38847c JART ECM v1 var
JART v-ECM v1 Aug 15, 2025 - Peter Grünberg Institute (PGI) – Electronic Materials (PGI-7) Ahmad, Rana Walied; Menzel, Stephan, 2025, "JART v-ECM v1", https://doi.org/10.26165/JUELICH-DATA/NDUPBU, Jülich DATA, V1 A comprehensive, novel and consistent volatile ECM model is proposed that is derived from the nonvolatile physics-based model "JART ECM v1" comprising electrocrystallization, electron-transfer reactions at the interfaces and ionic migration as speed limiting ionic processes. Addi...

data_readnoise_sample_C.pkl

Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

Unknown - 148.0 MB - SHA-256: 65b38a04f71cb4ec9bbd27987be7943234a24529f7df229b99dee676f24f4b6b

Functions_datahandle.py

Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

Python Source Code - 29.3 KB - SHA-256: 6f2c31315617763d3e3b03d6571619edc2567c13c3535217364fa88ec7f37e40

ReadMe.txt

Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

Plain Text - 2.1 KB - SHA-256: ee0d72deb8d8f29192558bb509bf664bdf4b92f5d69c87647d08d68e59bd184b

Store_data.py

Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

Python Source Code - 5.6 KB - SHA-256: 5449119bca17aaa988fc91e52f7f6a55e1e993e0aba0c817d6f79071984564a3

Automatische Standardsimulation mGROWA2025_B für das Land Nordrhein-Westfalen (NRW) für den Zeitraum 1961 bis zum Vormonat

Aug 15, 2025 - mGROWA North Rhine-Westphalia

Herrmann, Frank, 2025, "Automatische Standardsimulation mGROWA2025_B für das Land Nordrhein-Westfalen (NRW) für den Zeitraum 1961 bis zum Vormonat", https://doi.org/10.26165/JUELICH-DATA/ZNVQCX, Jülich DATA, V1

Die bereitgestellten Rasterdaten umfassen Monats- und Jahressummen mehrerer Wasserhaushaltsgrößen aus der derzeitigen Standardsimulation mGROWA2025_B mit dem Modell mGROWA. Die Standardsimulation startet im Jahr 1961 und wird monatlich im Rahmen des WHDM-NRW (Wasserhaushalts- und...

JART ECM v1 var

Aug 15, 2025 - Peter Grünberg Institute (PGI) – Electronic Materials (PGI-7)

Ahmad, Rana Walied; Menzel, Stephan, 2025, "JART ECM v1 var", https://doi.org/10.26165/JUELICH-DATA/WHSSZA, Jülich DATA, V1

A purely physics-based variability-aware compact model of electrochemical metallization memory (ECM) cells is presented. Since this extension consists of several different features allowing for a realistic variability-aware fit, it depicts a unique model comprising physics-based,...

Figure4-1.svg

Aug 15, 2025 - JART ECM v1 var

SVG Image - 472.2 KB - SHA-256: f26c2966faa0d6b864005f77e04cf39fd43c806141d3c40295712f5feb5b964c

[1] (a) Experimentally measured and (b) simulatively verified device-to-device variability for SET kinetics analysis. Simulation also includes the SET kinetics curve obtained by mean parameter values (in black). It shows the first steeper slope from 0.3–3.5 V related to the elec...

Figure5-1.svg

Aug 15, 2025 - JART ECM v1 var

SVG Image - 3.5 MB - SHA-256: 43512b47f9b59bfa5115c31ecd176af8ed90db32194f30370b8b98abde9e3537

[2] Experimentally measured I–V sweeps in red, simulated I–V sweeps in blue: (a) experimentally recorded I–V sweep, (b) simulated I–V sweep characteristics with all four modifications, (c) only staircase I–V sweep and parameter variation after each SET and RESET, (d) only stair...

veriloga.va

Aug 15, 2025 - JART ECM v1 var

Unknown - 16.8 KB - SHA-256: 606b87666352d6eb8141790f1e42232982be8ac3e92169198ed520a88a38847c

JART ECM v1 var

JART v-ECM v1

Aug 15, 2025 - Peter Grünberg Institute (PGI) – Electronic Materials (PGI-7)

Ahmad, Rana Walied; Menzel, Stephan, 2025, "JART v-ECM v1", https://doi.org/10.26165/JUELICH-DATA/NDUPBU, Jülich DATA, V1

A comprehensive, novel and consistent volatile ECM model is proposed that is derived from the nonvolatile physics-based model "JART ECM v1" comprising electrocrystallization, electron-transfer reactions at the interfaces and ionic migration as speed limiting ionic processes. Addi...

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