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21 to 30 of 18,952 Results

data_readnoise_sample_A_and_B.pkl Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices Unknown - 254.9 MB - SHA-256: 3a5dd916d8c9bb1f1d26cc6f3b311f77d952ddaa78918a7c7e85718058893cd4
data_readnoise_sample_C.pkl Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices Unknown - 148.0 MB - SHA-256: 65b38a04f71cb4ec9bbd27987be7943234a24529f7df229b99dee676f24f4b6b
Functions_datahandle.py Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices Python Source Code - 29.3 KB - SHA-256: 6f2c31315617763d3e3b03d6571619edc2567c13c3535217364fa88ec7f37e40
ReadMe.txt Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices Plain Text - 2.1 KB - SHA-256: ee0d72deb8d8f29192558bb509bf664bdf4b92f5d69c87647d08d68e59bd184b
Store_data.py Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices Python Source Code - 5.6 KB - SHA-256: 5449119bca17aaa988fc91e52f7f6a55e1e993e0aba0c817d6f79071984564a3
Figure4-1.svg Aug 15, 2025 - JART ECM v1 var SVG Image - 472.2 KB - SHA-256: f26c2966faa0d6b864005f77e04cf39fd43c806141d3c40295712f5feb5b964c [1] (a) Experimentally measured and (b) simulatively verified device-to-device variability for SET kinetics analysis. Simulation also includes the SET kinetics curve obtained by mean parameter values (in black). It shows the first steeper slope from 0.3–3.5 V related to the elec...
Figure5-1.svg Aug 15, 2025 - JART ECM v1 var SVG Image - 3.5 MB - SHA-256: 43512b47f9b59bfa5115c31ecd176af8ed90db32194f30370b8b98abde9e3537 [2] Experimentally measured I–V sweeps in red, simulated I–V sweeps in blue: (a) experimentally recorded I–V sweep, (b) simulated I–V sweep characteristics with all four modifications, (c) only staircase I–V sweep and parameter variation after each SET and RESET, (d) only stair...
veriloga.va Aug 15, 2025 - JART ECM v1 var Unknown - 16.8 KB - SHA-256: 606b87666352d6eb8141790f1e42232982be8ac3e92169198ed520a88a38847c JART ECM v1 var
Figure 3 new-1.svg Aug 15, 2025 - JART v-ECM v1 SVG Image - 996.7 KB - SHA-256: e05d35a6ca3c658a0b666d197f06274eedd3345bb03f215fe47638d111116a64 [1] (a) 30 cycles of measured I-V sweeps of a Ag-HfO2-Pt ECM device stack are shown. A c2c variability is visible. (b) 30 cycles of simulated I-V sweeps are shown through the usage of the (variability-aware) volatile ECM model. For both, measurement and simulation, the device...
Figure 4 new-1.svg Aug 15, 2025 - JART v-ECM v1 SVG Image - 563.5 KB - SHA-256: e8ced5836ba74af09e38ac51313c2061a7aef7697b7e94c37d2d5f99d4a97bfd [2] The experimentally measured threshold switching kinetics data points of a Ag-HfO2-Pt ECM device stack together with their d2d variability are displayed in red, whereas the simulated ones with their d2d variability are displayed in blue.

data_readnoise_sample_A_and_B.pkl

Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

Unknown - 254.9 MB - SHA-256: 3a5dd916d8c9bb1f1d26cc6f3b311f77d952ddaa78918a7c7e85718058893cd4

data_readnoise_sample_C.pkl

Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

Unknown - 148.0 MB - SHA-256: 65b38a04f71cb4ec9bbd27987be7943234a24529f7df229b99dee676f24f4b6b

Functions_datahandle.py

Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

Python Source Code - 29.3 KB - SHA-256: 6f2c31315617763d3e3b03d6571619edc2567c13c3535217364fa88ec7f37e40

ReadMe.txt

Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

Plain Text - 2.1 KB - SHA-256: ee0d72deb8d8f29192558bb509bf664bdf4b92f5d69c87647d08d68e59bd184b

Store_data.py

Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

Python Source Code - 5.6 KB - SHA-256: 5449119bca17aaa988fc91e52f7f6a55e1e993e0aba0c817d6f79071984564a3

Figure4-1.svg

Aug 15, 2025 - JART ECM v1 var

SVG Image - 472.2 KB - SHA-256: f26c2966faa0d6b864005f77e04cf39fd43c806141d3c40295712f5feb5b964c

[1] (a) Experimentally measured and (b) simulatively verified device-to-device variability for SET kinetics analysis. Simulation also includes the SET kinetics curve obtained by mean parameter values (in black). It shows the first steeper slope from 0.3–3.5 V related to the elec...

Figure5-1.svg

Aug 15, 2025 - JART ECM v1 var

SVG Image - 3.5 MB - SHA-256: 43512b47f9b59bfa5115c31ecd176af8ed90db32194f30370b8b98abde9e3537

[2] Experimentally measured I–V sweeps in red, simulated I–V sweeps in blue: (a) experimentally recorded I–V sweep, (b) simulated I–V sweep characteristics with all four modifications, (c) only staircase I–V sweep and parameter variation after each SET and RESET, (d) only stair...

veriloga.va

Aug 15, 2025 - JART ECM v1 var

Unknown - 16.8 KB - SHA-256: 606b87666352d6eb8141790f1e42232982be8ac3e92169198ed520a88a38847c

JART ECM v1 var

Figure 3 new-1.svg

Aug 15, 2025 - JART v-ECM v1

SVG Image - 996.7 KB - SHA-256: e05d35a6ca3c658a0b666d197f06274eedd3345bb03f215fe47638d111116a64

[1] (a) 30 cycles of measured I-V sweeps of a Ag-HfO2-Pt ECM device stack are shown. A c2c variability is visible. (b) 30 cycles of simulated I-V sweeps are shown through the usage of the (variability-aware) volatile ECM model. For both, measurement and simulation, the device...

Figure 4 new-1.svg

Aug 15, 2025 - JART v-ECM v1

SVG Image - 563.5 KB - SHA-256: e8ced5836ba74af09e38ac51313c2061a7aef7697b7e94c37d2d5f99d4a97bfd

[2] The experimentally measured threshold switching kinetics data points of a Ag-HfO2-Pt ECM device stack together with their d2d variability are displayed in red, whereas the simulated ones with their d2d variability are displayed in blue.

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