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Jülich DATA (Forschungszentrum Jülich GmbH)
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TIFF Image - 50.5 MB - SHA-256: ede48627b47a76adbe8d16cb025d602b1a91ccc1e5d4d2515ebc43f3ede8e55e
Mar 25, 2025 - JART VCM v1b Readvar
JPEG Image - 86.3 KB - SHA-256: 8c03de87860afcf6b88c5c57f6e6c3e07e0dfd354e8d391c5f744c3e31c861ff
Mar 25, 2025 - JART VCM v1b Readvar
JPEG Image - 57.9 KB - SHA-256: fe98c17f4395198d434e1e251792b1eed0e1440a20b02627fe1b3f7635708485
Mar 25, 2025 - JART VCM v1 generic
JPEG Image - 103.6 KB - SHA-256: 983017ed3421407f288afa2818e2968127f646fd7d636ad9a25c67ce24f2aaba
Figure 1: (a) Equivalent circuit diagram of the simulation model showing the top electrode (TE), the bottom electrode (BE) and the active oxide layer. (b) Simulated I-V characteristics all resistance ratios r and the nonlinearity SL = 8.83 V-1. (c) Reset and (d) set times vs. app...
Mar 25, 2025 - JART ECM v1
JPEG Image - 100.4 KB - SHA-256: e47bd74017eb26c9eeb9f66304cfe0090420a71670ba04caebdc76fc280b8442
Ionic and Electronic process included in the JART ECM v1 model.
Mar 25, 2025 - JART VCM v1
JPEG Image - 39.7 KB - SHA-256: 19d125ff33876fe006dd0b31ed1681bcb32031ee2f623cc2b1031811eefa746a
Equivalent circuit diagram of the JART VCM v1 model.
Mar 25, 2025 - JART VCM v1
JPEG Image - 220.5 KB - SHA-256: b5bdc35559bd4f836c1c8955f2a592caa96fbf332272569cfc19c33bc5b14d57
Highly voltage-dependent characteristic numbers of SET pulse switching, obtained with both experiments and simulations [3]. The simulation differs from the published result in [1] regarding the parameters, the definition of the criteria, and Eqs. (3.5), (3.7) to (3.10) and (3.12)...
Mar 25, 2025 - JART VCM v1
JPEG Image - 158.4 KB - SHA-256: c92bb68722f7283e080f5dd4841c4a50b6abf450822d3968860b85e3c8348cf5
Parameter set for STO
Mar 25, 2025 - JART VCM v1b
JPEG Image - 61.6 KB - SHA-256: 0445d089fddea7ca09cb48409f828eddeaf3b8105ce3632cd0f8f7d44c92b737
Equivalent Circuit diagram of the JART VCM v1b var model
Mar 25, 2025 - JART VCM v1b
JPEG Image - 297.5 KB - SHA-256: f6e96dd7d19089f5e856d3854ab3ee6266f1de1a3c9fc26999a844cf41baa086
Measured device characteristics alongside results obtained using the extended compact model. The first row shows measured (a) and simulated (b) voltage sourced I-V sweeps. The second row shows the measured (c) and simulated (d) SET kinetics and the third row shows the measured (e...
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