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Jülich DATA (Forschungszentrum Jülich GmbH)
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21 to 30 of 19,309 Results
Figure5-1.svg
Aug 15, 2025 - JART ECM v1 var
SVG Image - 3.5 MB - SHA-256: 43512b47f9b59bfa5115c31ecd176af8ed90db32194f30370b8b98abde9e3537
[2] Experimentally measured I–V sweeps in red, simulated I–V sweeps in blue: (a) experimentally recorded I–V sweep, (b) simulated I–V sweep characteristics with all four modifications, (c) only staircase I–V sweep and parameter variation after each SET and RESET, (d) only stair...
veriloga.va
Aug 15, 2025 - JART ECM v1 var
Unknown - 16.8 KB - SHA-256: 606b87666352d6eb8141790f1e42232982be8ac3e92169198ed520a88a38847c
JART ECM v1 var
JART v-ECM v1
Aug 15, 2025 - Peter Grünberg Institute (PGI) – Electronic Materials (PGI-7)
Ahmad, Rana Walied; Menzel, Stephan, 2025, "JART v-ECM v1", https://doi.org/10.26165/JUELICH-DATA/NDUPBU, Jülich DATA, V1
A comprehensive, novel and consistent volatile ECM model is proposed that is derived from the nonvolatile physics-based model "JART ECM v1" comprising electrocrystallization, electron-transfer reactions at the interfaces and ionic migration as speed limiting ionic processes. Addi...
Figure 3 new-1.svg
Aug 15, 2025 - JART v-ECM v1
SVG Image - 996.7 KB - SHA-256: e05d35a6ca3c658a0b666d197f06274eedd3345bb03f215fe47638d111116a64
[1] (a) 30 cycles of measured I-V sweeps of a Ag-HfO2-Pt ECM device stack are shown. A c2c variability is visible. (b) 30 cycles of simulated I-V sweeps are shown through the usage of the (variability-aware) volatile ECM model. For both, measurement and simulation, the device...
Figure 4 new-1.svg
Aug 15, 2025 - JART v-ECM v1
SVG Image - 563.5 KB - SHA-256: e8ced5836ba74af09e38ac51313c2061a7aef7697b7e94c37d2d5f99d4a97bfd
[2] The experimentally measured threshold switching kinetics data points of a Ag-HfO2-Pt ECM device stack together with their d2d variability are displayed in red, whereas the simulated ones with their d2d variability are displayed in blue.
Figure 5 new-1.svg
Aug 15, 2025 - JART v-ECM v1
SVG Image - 20.9 MB - SHA-256: b8e0c44689a90ae87c7470684765ef9220ff2b618c22ce324442338db61e51b2
[3] (a) The applied voltage signal to a Ag-HfO2-Pt ECM device stack in the measurement and in the simulation in order to investigate the device’s relaxation behavior: The 1 ms programming/write pulse of Vp is followed by a read voltage Vread = 0.1 V. The inset shows that the sign...
veriloga.va
Aug 15, 2025 - JART v-ECM v1
Unknown - 10.9 KB - SHA-256: 6b8b1f93751a06906990947252b9f60dc833dd5718cc65e6a1362792816b7201
JART ECM v1 volatile
JART v-ECM v1 var
Aug 15, 2025 - Peter Grünberg Institute (PGI) – Electronic Materials (PGI-7)
Ahmad, Rana Walied; Menzel, Stephan, 2025, "JART v-ECM v1 var", https://doi.org/10.26165/JUELICH-DATA/RMT350, Jülich DATA, V1
A purely physics-based variability-aware compact model of voaltile electrochemical metallization memory (v-ECM) cells is presented. Since this extension consists of several different features allowing for a realistic variability-aware fit, it depicts a unique model comprising phy...
Figure 3 new.svg
Aug 15, 2025 - JART v-ECM v1 var
SVG Image - 996.7 KB - SHA-256: e05d35a6ca3c658a0b666d197f06274eedd3345bb03f215fe47638d111116a64
[1] (a) 30 cycles of measured I-V sweeps of a Ag-HfO2-Pt ECM device stack are shown. A c2c variability is visible. (b) 30 cycles of simulated I-V sweeps are shown through the usage of the variability-aware volatile ECM model. For both, measurement and simulation, the device switc...
Figure 4 new.svg
Aug 15, 2025 - JART v-ECM v1 var
SVG Image - 563.5 KB - SHA-256: e8ced5836ba74af09e38ac51313c2061a7aef7697b7e94c37d2d5f99d4a97bfd
[2] The experimentally measured threshold switching kinetics data points of a Ag-HfO2-Pt ECM device stack together with their d2d variability are displayed in red, whereas the simulated ones with their d2d variability are displayed in blue.
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