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1 to 10 of 454 Results

JART IBM PCM Jun 11, 2026 - Jülich Aachen ReRAM Tools (JART) Menzel, Stephan, 2026, "JART IBM PCM", https://doi.org/10.26165/JUELICH-DATA/IV3SBF, Jülich DATA, V1 In this work, a compact model for mushroom‐type phase‐change memory devices (JART PCM) is introduced that incorporates the shape and size of the amorphous mark under different programming conditions, and is applicable to both projecting and non‐projecting devices. The model inclu...
JART IBM PCM Mushroom v1-4.txt Jun 11, 2026 - JART IBM PCM Plain Text - 9.5 KB - SHA-256: 22cb72da73efe69a42aea2876bd79df976967c569e13929e66ad3cdb9d293f17 First version of JART IBM PCM Model in Verilog–A format.
Replication Data for: NPJ Unconventional Computing Submission "Reliability challenges for resistive random-access memory-based parallel logic computing" Dec 16, 2025 - Jülich Aachen ReRAM Tools (JART) Brackmann, Leon, 2025, "Replication Data for: NPJ Unconventional Computing Submission "Reliability challenges for resistive random-access memory-based parallel logic computing"", https://doi.org/10.26165/JUELICH-DATA/XKYQVK, Jülich DATA, V1 The dataset contains all raw data and python scripts (.py) for creating the figures Fig. 3 - Fig. 6 in the main manuscript "Reliability challenges for resistive random-access memory-based parallel logic computing" and the Fig. S3 in the corresponding supplementary information. Th...
NPJ.zip Dec 16, 2025 - Replication Data for: NPJ Unconventional Computing Submission "Reliability challenges for resistive random-access memory-based parallel logic computing" ZIP Archive - 33.7 MB - SHA-256: de84c855351eb993e55594de9116046859ef556f337176f2746031408f5025d9 Data includes Fig. 3 - Fig. 6 of main manuscript and Fig. 3 of supplementary
Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices Oct 30, 2025 Schnieders, Kristoffer; Stasner, Pascal; Bai, Peixuan; Wouters, Dirk; Wiefels, Stefan, 2025, "Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices", https://doi.org/10.26165/JUELICH-DATA/BO2NPG, Jülich DATA, V2 This dataset contains raw and processed read noise measurements from thermally oxidized TaOx-based VCM devices, supporting the analysis presented in the associated APL publication. The raw data includes 1 s current readout traces recorded after resistive switching. The evaluation...
EG_TO_16.zip Oct 30, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices ZIP Archive - 6.1 GB - MD5: 7009adc65b81a0a0f3157d8cd9d46434
EG_TO_23.zip Oct 30, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices ZIP Archive - 14.6 GB - MD5: 28fe8f564c947b0c590e0744f0f0ce3b
EG_TO_25.zip Oct 30, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices ZIP Archive - 13.3 GB - MD5: fa7f9b4a9b41b51a26b984f250392163
data_readnoise_sample_A_and_B.pkl Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices Unknown - 254.9 MB - SHA-256: 3a5dd916d8c9bb1f1d26cc6f3b311f77d952ddaa78918a7c7e85718058893cd4
data_readnoise_sample_C.pkl Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices Unknown - 148.0 MB - SHA-256: 65b38a04f71cb4ec9bbd27987be7943234a24529f7df229b99dee676f24f4b6b

JART IBM PCM

Jun 11, 2026 - Jülich Aachen ReRAM Tools (JART)

Menzel, Stephan, 2026, "JART IBM PCM", https://doi.org/10.26165/JUELICH-DATA/IV3SBF, Jülich DATA, V1

In this work, a compact model for mushroom‐type phase‐change memory devices (JART PCM) is introduced that incorporates the shape and size of the amorphous mark under different programming conditions, and is applicable to both projecting and non‐projecting devices. The model inclu...

JART IBM PCM Mushroom v1-4.txt

Jun 11, 2026 - JART IBM PCM

Plain Text - 9.5 KB - SHA-256: 22cb72da73efe69a42aea2876bd79df976967c569e13929e66ad3cdb9d293f17

First version of JART IBM PCM Model in Verilog–A format.

Replication Data for: NPJ Unconventional Computing Submission "Reliability challenges for resistive random-access memory-based parallel logic computing"

Dec 16, 2025 - Jülich Aachen ReRAM Tools (JART)

Brackmann, Leon, 2025, "Replication Data for: NPJ Unconventional Computing Submission "Reliability challenges for resistive random-access memory-based parallel logic computing"", https://doi.org/10.26165/JUELICH-DATA/XKYQVK, Jülich DATA, V1

The dataset contains all raw data and python scripts (.py) for creating the figures Fig. 3 - Fig. 6 in the main manuscript "Reliability challenges for resistive random-access memory-based parallel logic computing" and the Fig. S3 in the corresponding supplementary information. Th...

NPJ.zip

Dec 16, 2025 - Replication Data for: NPJ Unconventional Computing Submission "Reliability challenges for resistive random-access memory-based parallel logic computing"

ZIP Archive - 33.7 MB - SHA-256: de84c855351eb993e55594de9116046859ef556f337176f2746031408f5025d9

Data includes Fig. 3 - Fig. 6 of main manuscript and Fig. 3 of supplementary

Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

Oct 30, 2025

Schnieders, Kristoffer; Stasner, Pascal; Bai, Peixuan; Wouters, Dirk; Wiefels, Stefan, 2025, "Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices", https://doi.org/10.26165/JUELICH-DATA/BO2NPG, Jülich DATA, V2

This dataset contains raw and processed read noise measurements from thermally oxidized TaOx-based VCM devices, supporting the analysis presented in the associated APL publication. The raw data includes 1 s current readout traces recorded after resistive switching. The evaluation...

EG_TO_16.zip

Oct 30, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

ZIP Archive - 6.1 GB - MD5: 7009adc65b81a0a0f3157d8cd9d46434

EG_TO_23.zip

Oct 30, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

ZIP Archive - 14.6 GB - MD5: 28fe8f564c947b0c590e0744f0f0ce3b

EG_TO_25.zip

Oct 30, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

ZIP Archive - 13.3 GB - MD5: fa7f9b4a9b41b51a26b984f250392163

data_readnoise_sample_A_and_B.pkl

Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

Unknown - 254.9 MB - SHA-256: 3a5dd916d8c9bb1f1d26cc6f3b311f77d952ddaa78918a7c7e85718058893cd4

data_readnoise_sample_C.pkl

Aug 22, 2025 - Read noise variability in thermally oxidized Tantalum oxide-based ReRAM devices

Unknown - 148.0 MB - SHA-256: 65b38a04f71cb4ec9bbd27987be7943234a24529f7df229b99dee676f24f4b6b

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