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11 to 20 of 426 Results

Figure 5 new-1.svg Aug 15, 2025 - JART v-ECM v1 SVG Image - 20.9 MB - SHA-256: b8e0c44689a90ae87c7470684765ef9220ff2b618c22ce324442338db61e51b2 [3] (a) The applied voltage signal to a Ag-HfO2-Pt ECM device stack in the measurement and in the simulation in order to investigate the device’s relaxation behavior: The 1 ms programming/write pulse of Vp is followed by a read voltage Vread = 0.1 V. The inset shows that the sign...
veriloga.va Aug 15, 2025 - JART v-ECM v1 Unknown - 10.9 KB - SHA-256: 6b8b1f93751a06906990947252b9f60dc833dd5718cc65e6a1362792816b7201 JART ECM v1 volatile
Figure 3 new.svg Aug 15, 2025 - JART v-ECM v1 var SVG Image - 996.7 KB - SHA-256: e05d35a6ca3c658a0b666d197f06274eedd3345bb03f215fe47638d111116a64 [1] (a) 30 cycles of measured I-V sweeps of a Ag-HfO2-Pt ECM device stack are shown. A c2c variability is visible. (b) 30 cycles of simulated I-V sweeps are shown through the usage of the variability-aware volatile ECM model. For both, measurement and simulation, the device switc...
Figure 4 new.svg Aug 15, 2025 - JART v-ECM v1 var SVG Image - 563.5 KB - SHA-256: e8ced5836ba74af09e38ac51313c2061a7aef7697b7e94c37d2d5f99d4a97bfd [2] The experimentally measured threshold switching kinetics data points of a Ag-HfO2-Pt ECM device stack together with their d2d variability are displayed in red, whereas the simulated ones with their d2d variability are displayed in blue.
Figure 5 new.svg Aug 15, 2025 - JART v-ECM v1 var SVG Image - 20.9 MB - SHA-256: b8e0c44689a90ae87c7470684765ef9220ff2b618c22ce324442338db61e51b2 [3] (a) The applied voltage signal to a Ag-HfO2-Pt ECM device stack in the measurement and in the simulation in order to investigate the device’s relaxation behavior: The 1 ms programming/write pulse of Vp is followed by a read voltage Vread = 0.1 V. The inset shows that the sign...
veriloga.va Aug 15, 2025 - JART v-ECM v1 var Unknown - 17.1 KB - SHA-256: 042e2482fd5de9844011af4607afe6083a0b7348aea442ec92f2dea8a8353bf2
JART_VCM_Rth_Fig1.jpg Jul 15, 2025 - JART VCM Rth JPEG Image - 68.1 KB - SHA-256: 65cd826d38a25a0df684249a7e317762e001d3bfebaf625f930a0ea96ce53d14 This figure shows that the validation with TaOx-based VCM devices co-integrated with 180 nm n-MOS transistors demonstrates the model’s accuracy, achieving consistent multilevel programming across 7-states and capturing cycle-to-cycle variability effectively.
JART VCM Rth veriloga.va Jul 15, 2025 - JART VCM Rth Unknown - 9.4 KB - SHA-256: 52fced1bc167aa19129a3087e140814324a44a14753bd691a5645cc3bea5b98a The Verilog-A code of this model
JART_TC.exe Mar 26, 2025 - JART TC Windows Executable - 68.0 MB - SHA-256: b8f66854beb3e5f1699a96a608dbab2c7520b19fa82e80893ab9a466ff82ce9a COMSOL App without runtime
JART_TC_runtime.exe Mar 26, 2025 - JART TC Windows Executable - 1.2 GB - SHA-256: bb25c9e2785b4b9e0e6364636b272a5ebad510d82f2da858593918e0799243fc COMSOL App with runtime

Figure 5 new-1.svg

Aug 15, 2025 - JART v-ECM v1

SVG Image - 20.9 MB - SHA-256: b8e0c44689a90ae87c7470684765ef9220ff2b618c22ce324442338db61e51b2

[3] (a) The applied voltage signal to a Ag-HfO2-Pt ECM device stack in the measurement and in the simulation in order to investigate the device’s relaxation behavior: The 1 ms programming/write pulse of Vp is followed by a read voltage Vread = 0.1 V. The inset shows that the sign...

veriloga.va

Aug 15, 2025 - JART v-ECM v1

Unknown - 10.9 KB - SHA-256: 6b8b1f93751a06906990947252b9f60dc833dd5718cc65e6a1362792816b7201

JART ECM v1 volatile

Figure 3 new.svg

Aug 15, 2025 - JART v-ECM v1 var

SVG Image - 996.7 KB - SHA-256: e05d35a6ca3c658a0b666d197f06274eedd3345bb03f215fe47638d111116a64

[1] (a) 30 cycles of measured I-V sweeps of a Ag-HfO2-Pt ECM device stack are shown. A c2c variability is visible. (b) 30 cycles of simulated I-V sweeps are shown through the usage of the variability-aware volatile ECM model. For both, measurement and simulation, the device switc...

Figure 4 new.svg

Aug 15, 2025 - JART v-ECM v1 var

SVG Image - 563.5 KB - SHA-256: e8ced5836ba74af09e38ac51313c2061a7aef7697b7e94c37d2d5f99d4a97bfd

[2] The experimentally measured threshold switching kinetics data points of a Ag-HfO2-Pt ECM device stack together with their d2d variability are displayed in red, whereas the simulated ones with their d2d variability are displayed in blue.

Figure 5 new.svg

Aug 15, 2025 - JART v-ECM v1 var

SVG Image - 20.9 MB - SHA-256: b8e0c44689a90ae87c7470684765ef9220ff2b618c22ce324442338db61e51b2

veriloga.va

Aug 15, 2025 - JART v-ECM v1 var

Unknown - 17.1 KB - SHA-256: 042e2482fd5de9844011af4607afe6083a0b7348aea442ec92f2dea8a8353bf2

JART_VCM_Rth_Fig1.jpg

Jul 15, 2025 - JART VCM Rth

JPEG Image - 68.1 KB - SHA-256: 65cd826d38a25a0df684249a7e317762e001d3bfebaf625f930a0ea96ce53d14

This figure shows that the validation with TaOx-based VCM devices co-integrated with 180 nm n-MOS transistors demonstrates the model’s accuracy, achieving consistent multilevel programming across 7-states and capturing cycle-to-cycle variability effectively.

JART VCM Rth veriloga.va

Jul 15, 2025 - JART VCM Rth

Unknown - 9.4 KB - SHA-256: 52fced1bc167aa19129a3087e140814324a44a14753bd691a5645cc3bea5b98a

The Verilog-A code of this model

JART_TC.exe

Mar 26, 2025 - JART TC

Windows Executable - 68.0 MB - SHA-256: b8f66854beb3e5f1699a96a608dbab2c7520b19fa82e80893ab9a466ff82ce9a

COMSOL App without runtime

JART_TC_runtime.exe

Mar 26, 2025 - JART TC

Windows Executable - 1.2 GB - SHA-256: bb25c9e2785b4b9e0e6364636b272a5ebad510d82f2da858593918e0799243fc

COMSOL App with runtime

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